READ ME This text describes the data presented in the paper: Voltage controlled hot carrier injection enables ohmic contacts using Au Island Metal Films on Ge ======================== Introductory information ======================== Files included in the data deposit (include a short description of what data are contained): The data contains I-V measurements of IMF and CMF contacts to n and p-Ge. In addition, microscopy investigations (images), XRD crystallography studies (data), hot electron emission spectroscopy data have been included. Explain the relationship between multiple data sets, if required: N/A Key words used to describe the data: I-V, STEM, EFTEM, HRSEM, EBSD, IMF, CMF ========================== Methodological information ========================== A brief method description – what the data is, how and why it was collected or created, and how it was processed: I-V measurements are used to characterize elecronic transport phenomenon in metal semiconductor contacts. Using I-V data, we observe hot carrier current despite the condition of Fermi level pinning in Ge. Data is automatically generated by the Keithley 4200 SCS software as the measurement is performed. These data are then plotted using Origin Pro 2015 (student license). The electron emission spectroscopy data is also generated by the Thermo Fisher Theta probe instrument software, as the measurement is being performed. Microscopy investigations were commissioned to Liverpool University to identify materials structure (see below for details). XRD measurements complement EBSD results and show strong orientation relationships between Au and Ge. Instruments, hardware and software used: Keithley SCS integrated with CASCADE high temperature testing rig for room temperature I-V measurements. Spatially resolved energy filtered TEM (EFTEM) chemical maps were collected using a Gatan imaging filter (GIF) Quantum SE (model 963), fitted to a JEOL 2100FCs microscope. Scanning electron microscope (SEM) images were recorded using a directional backscattered electron detector, 13 fitted to a FEI Helios 600i Dual Beam FIB instrument operating at 5 kV. Electron backscattered diffraction (EBSD) analyses were performed on the same instrument, using an EDAX DigiView EBSD system; data collection and analyses were performed using EDAX OIM software. Bright field/ Dark field scanning transmission electron microscopy (BF/DF-STEM) was carried out in a JEOL 2100FCs, probe side aberration corrected instrument, operating at 200kV. X-ray diffraction (XRD) was measured using Rigaku Smartlab equipped with parallel beam optics. Electron emission spectra were measured in a Thermo Fisher Scientific Theta Probe X-ray Photoelectron Spectrometer fitted with electrical feed-throughs for in vacuo electrical measurements. Electrical bias was supplied by a Keithley (2600) SMU. Graphs were prepared using Origin Pro 2015. Date(s) of data collection: 07/2015 - 07/2017 Geographic coverage of data: Newcastle upon Tyne, London, Liverpool, Helsinki Data validation (how was the data checked, proofed and cleaned): The I-V data and electron emission spectra are presented as obtained, without any processing. The measurements were confirmed to be repeatable and reproducible at Newcastle University and independently at Royal Holloway University of London (at room temperature and 4.2 K ). Microscopy work was commissioned to experts at Liverpool University microscopy centre. Similarly, XRD experiments were done at Helsinki University by experts and confirmed to be reproducible and repeatable. These studies corroborate EBSD investigations done at Liverpool University. Overview of secondary data, if used: N/A ========================= Data-specific information ========================= Definitions of names, labels, acronyms or specialist terminology uses for variables, records and their values: IMF- Island metal Films CMF- Continuous metal films EFTEM - Energy filtered transmission electron microscopy EBSD- Electron backscatter diffraction XRD - X-ray diffraction I-V - Current-voltage HRSEM- High resolution scanning electron microscopy Explanation of weighting and grossing variables: N/A Outline any missing data: N/A ======= Contact ======= Please contact rdm@ncl.ac.uk for further information