AFM images of interdigitated ITO electrodes with thin film of POM deposited

A Digital Instruments Multimode-8 with a NanoScope V controller and E scanners (Bruker) was used for acquiring AFM images. The AFM data were analysed with NanoScope Analysis 1.50 software (Bruker). The AFM was operated in tapping mode. An isolation table (Veeco Inc., Metrology Group) was used to minimise vibrational noise. Aluminium-coated silicon tips on silicon cantilevers (Tap300Al-G, BudgetSensors) were used for imaging. The nominal tip curvature radius was approximately <10 nm, resonant frequency ~300 kHz and spring constant k ~ 40 Nm-1. The film thickness was measured by using the AFM tip at a strong force in contact mode to scratch away a 1 µm2 area of the of the film (aspect ratio 20:1), exposing the glass underneath. A new tip was then used to image the area in tapping mode over the scratch to measure the height in the z-direction of the film.