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4H-SiC MOSFETs data calculation
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posted on 2018-01-01, 00:00
authored by
F Arith
The data for IEEE Electron Device Letter paper was calculated in excel file. All parameter and calculation based on equation is shown in the same file.
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Keywords
Field Effect Mobility
Density of Interface Traps (Dit)
Effective Electric Field in Silicon Carbide
Effective Electric Field in Dielectric
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