%0 Generic %A Arith, F %D 2018 %T 4H-SiC MOSFETs data calculation %U https://data.ncl.ac.uk/articles/dataset/4H-SiC_MOSFETs_data_calculation/10281791 %R 10.17634/120975-1 %K Field Effect Mobility %K Density of Interface Traps (Dit) %K Effective Electric Field in Silicon Carbide %K Effective Electric Field in Dielectric %X The data for IEEE Electron Device Letter paper was calculated in excel file. All parameter and calculation based on equation is shown in the same file. %I Newcastle University